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首页> 外文期刊>Nuclear instruments and methods in physics research >Charged kaon mass measurement using the Cherenkov effect
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Charged kaon mass measurement using the Cherenkov effect

机译:利用契伦科夫效应进行带电kaon质量测量

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The two most recent and precise measurements of the charged kaon mass use X-rays from kaonic atoms and report uncertainties of 14 and 22ppm yet differ from each other by 122 ppm. We describe the possibility of an independent mass measurement using the measurement of Cherenkov light from a narrow-band beam of kaons, pions, and protons. This technique was demonstrated using data taken opportunistically by the Main Injector Particle Production experiment at Fermi National Accelerator Laboratory which recorded beams of protons, kaons, and pions ranging in momentum from + 37 to + 63 GeV/c. The measured value is 491.3 + 1.7 MeV/c~2, which is within 1.4σ of the world average. An improvement of two orders of magnitude in precision would make this technique useful for resolving the ambiguity in the X-ray data and may be achievable in a dedicated experiment.
机译:带电钾离子质量的两个最新,最精确的测量方法是使用来自钾离子的X射线,其不确定度分别为14ppm和22ppm,但相差122 ppm。我们描述了使用从凯恩斯,介子和质子的窄带束中切伦科夫光进行测量进行独立质量测量的可能性。使用费米国家加速器实验室的主要喷射器粒子生产实验所获得的数据,对该技术进行了证明,该实验记录了质子束,钾离子和介子束的动量范围为+ 37至+ 63 GeV / c。测量值是491.3 + 1.7 MeV / c〜2,在世界平均值的1.4σ以内。精度提高两个数量级将使该技术可用于解决X射线数据中的歧义,并且可以在专用实验中实现。

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