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A semi-analytic approximation of charge induction in monolithic pixelated CdZnTe radiation detectors

机译:整体式像素化CdZnTe辐射探测器中电荷感应的半解析近似

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A semi-analytic approximation to the weighting potential within monolithic pixelated CdZnTe radiation detectors is presented. The approximation is based on solving the multi-dimensional Laplace equation that results upon replacing rectangular pixels with equal-area circular pixels. Further, we utilize the simplicity of the resulting approximate weighting potential to extend the well-known Hecht equation, describing charge induction in a parallel plate detector, to that approximating the multi-dimensional charge induction within a pixelated detector. These newly found expressions for the weighting potential and charge induction in a pixelated detector are compared throughout to full 3D electrostatic and monte carlo simulations using eVDSIM (eV Microelectronics Device SIMulator). The semi-analytic expressions derived in this paper can be evaluated quickly, and can therefore be used to efficiently reduce the size and dimensionality of the parameter space on which a detailed 3D numerical analysis is needed for pixelated detector design in a wide range of applications.
机译:提出了单片像素化CdZnTe辐射探测器内加权势的半解析近似。该近似基于求解多维Laplace方程的结果,该方程是将矩形像素替换为等面积的圆形像素而得到的。此外,我们利用所得近似加权势的简单性将描述平行板检测器中的电荷感应的众所周知的Hecht方程扩展到近似像素化检测器中的多维电荷感应的方程。在像素化检测器中,这些新发现的加权势和电荷感应表达式将与使用eVDSIM(eV微电子设备仿真器)进行的完整3D静电和蒙特卡洛仿真进行比较。本文中得出的半解析表达式可以快速评估,因此可用于有效减少参数空间的尺寸和维数,在该应用中,像素化探测器设计在广泛的应用中需要详细的3D数值分析。

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