NIST NSLS-II spectroscopy beamline optical plan for soft and tender X-ray spectroscopy and microscopy (100 eV to 7.5 keV)

摘要

We describe the NIST multi-station beamline complex planned for NSLS-II. The beamline complex is based on two canted undulators, one for soft X-rays (0.1 -2.0 keV) and one for tender X-rays (2-7.5 keV). The complex will have a total of six experimental stations, three on the soft X-ray branch and three on the tender X-ray branch, thereby serving a variety of soft and tender X-ray spectroscopy experiments. Two of the tender X-ray branch experimental endstations (HAXPES/NEXAFS and the XPS nanoscope) can be illuminated by both the soft and tender X-ray undulators, either sequentially or simultaneously, providing a continuous selection of X-rays from 100 eV to 7.5 keV. In this paper, the expected beamline performance at the XPS nanoscope endstation, for both the soft and tender X-ray sources, is presented.