Energy-discrimination X-ray computed tomography system utilizing a silicon-PIN detector and its application to 2.0-keV-width K-edge imaging

摘要

Demonstration of narrow-energy-width computed tomography (CT) was carried out by means of energy-discrimination. An X-ray CT system is of a first-generation type and consists of an X-ray generator, a turntable, a translation stage, a two-stage controller, a silicon-PIN detector system with amplifiers, a multi-channel analyzer (MCA), a counter card (CC), and a personal computer (PC). CT is accomplished by repeating the translation and the rotation of an object, and projection curves of the object are obtained by the translation of the moving object. Both photon-energy level and energy width are determined by the MCA, and the pulses of the discriminated event signal from the MCA are counted by CC in conjunction with PC. The maximum count rate was approximately 300 cps (counts per second) with energy widths of 2.0 keV, and energy-discrimination CT was carried out with a photon-energy resolution of 0.15 keV. To perform iodine K-edge CT, X-ray photons with an energy range from 33.2 to 35.2 keV were used. Next, to carry out cerium K-edge CT, an energy range from 40.3 to 42.3 keV was selected.