首页> 外文期刊>Nuclear Instruments & Methods in Physics Research >Investigation of crystal surface finish and geometry on single LYSO scintillator detector performance for depth-of-interaction measurement with silicon photomultipliers
【24h】

Investigation of crystal surface finish and geometry on single LYSO scintillator detector performance for depth-of-interaction measurement with silicon photomultipliers

机译:使用硅光电倍增管进行相互作用深度测量的单个LYSO闪烁体探测器性能上的晶体表面光洁度和几何形状研究

获取原文
获取原文并翻译 | 示例
           

摘要

Depth of Interaction (DOI) information can improve quality of reconstructed images acquired from Positron Emission Tomography (PET), especially in high resolution and compact scanners dedicated for breast, brain, or small animal imaging applications. Additionally, clinical scanners with time of flight capability can also benefit from DOI information. One of the most promising methods of determining DOI in a crystal involves reading the signal from two ends of a scintillation crystal, and calculating the signal ratio between the two detectors. This method is known to deliver a better DOI resolution with rough crystals compared to highly polished crystals. However, what is still not well studied is how much of a tradeoff is involved between spatial, energy, temporal, and DOI resolutions as a function of the crystal surface treatment and geometry with the use of Silicon Photomultipliers (SiPM) as the photo detectors. This study investigates the effects of different crystal surface finishes and geometries on energy, timing and DOI resolutions at different crystal depths. The results show that for LYSO scintillators of 1.5 × 1.5 × 20 mm~3 and 2 × 2 × 20 mm~3 with their surfaces finished from 0.5 to 30 μm roughness, almost the same energy and coincidence timing resolutions were maintained, around 15% and 2.4 ns, respectively across different crystal depths, while the DOI resolutions were steadily improved from worse than 5 mm to better than 2 mm. They demonstrate that crystal roughness, with proper surface preparing, does not have a significant effect on the energy and coincidence timing resolutions in the crystals examined, and there does not appear to be a tradeoff between improving DOI resolution and degrading other detector performances. These results will be valuable to guide the selection of crystal surface conditions for developing a DOI measurable PET detector with a full array of LYSO scintillators coupled to SiPM arrays.
机译:相互作用深度(DOI)信息可以提高从正电子发射断层扫描(PET)获取的重建图像的质量,特别是在专用于乳房,大脑或小型动物成像应用的高分辨率和紧凑型扫描仪中。此外,具有飞行时间功能的临床扫描仪也可以从DOI信息中受益。确定晶体中DOI的最有前途的方法之一是从闪烁晶体的两端读取信号,并计算两个检测器之间的信号比。众所周知,与高度抛光的晶体相比,这种方法对于粗糙的晶体可以提供更好的DOI分辨率。然而,仍然没有很好的研究是使用硅光电倍增管(SiPM)作为光电探测器,在空间,能量,时间和DOI分辨率之间进行折衷,这取决于晶体表面处理和几何形状。这项研究调查了不同晶体表面光洁度和几何形状对不同晶体深度下的能量,时间和DOI分辨率的影响。结果表明,对于LYSO闪烁体,其1.5×1.5×20 mm〜3和2×2×20 mm〜3的表面粗糙度为0.5至30μm,保持了几乎相同的能量和一致的定时分辨率,约为15%分别在不同的晶体深度上分别具有2.4 ns和2.4 ns的分辨率,而DOI分辨率则从低于5 mm稳定提高至高于2 mm。他们证明,通过适当的表面准备,晶体粗糙度不会对所检查晶体的能量和同时定时分辨率产生重大影响,并且在提高DOI分辨率和降低其他检测器性能之间似乎没有权衡取舍。这些结果对于指导晶体表面条件的选择对于开发具有耦合到SiPM阵列的完整LYSO闪烁体阵列的DOI可测量PET检测器将是有价值的。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号