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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research >The multipurpose X-ray diffraction end-station of the BM25B-SpLine synchrotron beamline at the ESRF
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The multipurpose X-ray diffraction end-station of the BM25B-SpLine synchrotron beamline at the ESRF

机译:BM25B-SpLine同步加速器光束线在ESRF的多用途X射线衍射终端

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摘要

The Spanish BM25-SpLine beamline at the European Synchrotron Radiation Facility allocates in the first focal point of Branch B a versatile experimental set-up devoted to X-ray diffraction studies. X-Ray Reflectivity, Reciprocal Space Maps, Surface, Single Crystal, Grazing Incidence and High Resolution Powder Diffraction can be performed using a point detector or a 2D detector (Charge-Coupled Device), in combination with many sample environment setups. A detailed description of the end-station is presented, including several examples that demonstrate the excellent capabilities of the setup.
机译:欧洲同步辐射装置的西班牙BM25-SpLine光束线在B分支的第一个焦点处分配了专用于X射线衍射研究的多功能实验装置。可以使用点检测器或2D检测器(电荷耦合器件)结合许多示例环境设置来执行X射线反射率,倒易空间图,表面,单晶,掠入射和高分辨率粉末衍射。给出了对终端站的详细说明,包括几个示例,这些示例演示了设置的出色功能。

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    Spanish CRG BM25-SpLine beamline at the ESRF, 6 Rue Jules Horowitz, BP 220, F-38043 Grenoble Cedex 09, France,Instituto de Ciencia de Materiales de Madrid-ICMM/CSIC, Cantoblanco, E-28049 Madrid, Spain;

    Spanish CRG BM25-SpLine beamline at the ESRF, 6 Rue Jules Horowitz, BP 220, F-38043 Grenoble Cedex 09, France,Instituto de Ciencia de Materiales de Madrid-ICMM/CSIC, Cantoblanco, E-28049 Madrid, Spain;

    Spanish CRG BM25-SpLine beamline at the ESRF, 6 Rue Jules Horowitz, BP 220, F-38043 Grenoble Cedex 09, France,Instituto de Ciencia de Materiales de Madrid-ICMM/CSIC, Cantoblanco, E-28049 Madrid, Spain;

    Spanish CRG BM25-SpLine beamline at the ESRF, 6 Rue Jules Horowitz, BP 220, F-38043 Grenoble Cedex 09, France,Instituto de Ciencia de Materiales de Madrid-ICMM/CSIC, Cantoblanco, E-28049 Madrid, Spain;

    Spanish CRG BM25-SpLine beamline at the ESRF, 6 Rue Jules Horowitz, BP 220, F-38043 Grenoble Cedex 09, France,Instituto de Ciencia de Materiales de Madrid-ICMM/CSIC, Cantoblanco, E-28049 Madrid, Spain;

    Spanish CRG BM25-SpLine beamline at the ESRF, 6 Rue Jules Horowitz, BP 220, F-38043 Grenoble Cedex 09, France,Instituto de Ciencia de Materiales de Madrid-ICMM/CSIC, Cantoblanco, E-28049 Madrid, Spain;

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  • 正文语种 eng
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  • 关键词

    X-Ray Reflectivity; Surface Diffraction; Single Crystal Diffraction; Reciprocal Space Maps; Grazing Incidence Diffraction; High Resolution Powder Diffraction;

    机译:X射线反射率;表面衍射;单晶衍射互惠空间图;放牧入射衍射高分辨率粉末衍射;

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