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A new background subtraction method for energy dispersive X-ray fluorescence spectra using a cubic spline interpolation

机译:基于三次样条插值的能量色散X射线荧光光谱背景扣除的新方法

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摘要

A new method is presented to subtract the background from the energy dispersive X-ray fluorescence (EDXRF) spectrum using a cubic spline interpolation. To accurately obtain interpolation nodes, a smooth fitting and a set of discriminant formulations were adopted. From these interpolation nodes, the background is estimated by a calculated cubic spline function. The method has been tested on spectra measured from a coin and an oil painting using a confocal MXRF setup. In addition, the method has been tested on an existing sample spectrum. The result confirms that the method can properly subtract the background.
机译:提出了一种使用三次样条插值从能量色散X射线荧光(EDXRF)光谱中减去背景的新方法。为了准确地获得插值节点,采用了平滑拟合和一组判别公式。从这些插值节点,通过计算的三次样条函数估算背景。该方法已在使用共聚焦MXRF装置从硬币和油画测量的光谱上进行了测试。此外,该方法已在现有样品光谱上进行了测试。结果证实该方法可以适当地减去背景。

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    The Key Laboratory of Beam Technology and Material Modification of the Ministry of Education, Beijing Normal University, Beijing 100875, China ,College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875, China ,Beijing Radiation Center, Beijing 100875, China;

    The Key Laboratory of Beam Technology and Material Modification of the Ministry of Education, Beijing Normal University, Beijing 100875, China ,College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875, China ,Beijing Radiation Center, Beijing 100875, China;

    The Key Laboratory of Beam Technology and Material Modification of the Ministry of Education, Beijing Normal University, Beijing 100875, China ,College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875, China ,Beijing Radiation Center, Beijing 100875, China;

    The Key Laboratory of Beam Technology and Material Modification of the Ministry of Education, Beijing Normal University, Beijing 100875, China ,College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875, China ,Beijing Radiation Center, Beijing 100875, China;

    The Key Laboratory of Beam Technology and Material Modification of the Ministry of Education, Beijing Normal University, Beijing 100875, China ,College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875, China ,Beijing Radiation Center, Beijing 100875, China;

    The Key Laboratory of Beam Technology and Material Modification of the Ministry of Education, Beijing Normal University, Beijing 100875, China ,College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875, China ,Beijing Radiation Center, Beijing 100875, China;

    The Key Laboratory of Beam Technology and Material Modification of the Ministry of Education, Beijing Normal University, Beijing 100875, China ,College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875, China ,Beijing Radiation Center, Beijing 100875, China;

    The Key Laboratory of Beam Technology and Material Modification of the Ministry of Education, Beijing Normal University, Beijing 100875, China ,College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875, China ,Beijing Radiation Center, Beijing 100875, China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    XRF; Background subtraction; Cubic spline function; Stripping peaks;

    机译:XRF;背景扣除;三次样条函数;剥离峰;

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