首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment >Accelerator test of an improved Angle Detecting Inclined Sensor (ADIS) prototype with beams of ~(78)Kr and fragments
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Accelerator test of an improved Angle Detecting Inclined Sensor (ADIS) prototype with beams of ~(78)Kr and fragments

机译:带有〜(78)Kr光束和碎片的改进型角度检测倾斜传感器(ADIS)原型的加速器测试

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The measurement of cosmic rays and Solar energetic particles in space is basic to our understanding of the Galaxy, the Sun, phenomena in the heliosphere and the emerging field of space weather. For these reasons, cosmic ray instruments are common on both scientific spacecraft and operational spacecraft such as weather satellites. Cosmic rays and Solar energetic particles include ions over the full range of elements found in the Solar System. High-resolution measurements of the elemental and isotopic composition require the angle of incidence of these energetic ions be determined to correct for pathlength variation in detectors within an instrument. The Angle Detecting Inclined Sensor (ADIS) system is a simple detector configuration used to determine the angle of incidence of heavy ions in space instruments. ADIS replaces complex position sensing detectors (PSDs) with a system of simple, reliable and robust detectors inclined at an angle to the instrument axis. An ADIS instrument thus offers significant advantages in mass, power, telemetry and cost. In February 2008 an improved ADIS prototype was tested with a 150 MeV/u ~(78)Kr beam at the National Superconducting Cyclotron Laboratory's (NSCL) Coupled Cyclotron Facility (CCF). This demonstrated a charge resolution of ρ ~ 0.3 e at Kr (Z=36), an exceptional charge resolution for such a simple instrument system.
机译:太空中宇宙射线和太阳高能粒子的测量是我们了解银河系,太阳,太阳系层中的现象以及新兴的太空天气领域的基础。由于这些原因,宇宙射线仪器在科学航天器和气象卫星等操作航天器中都是常见的。宇宙射线和太阳高能粒子包含了太阳系中所有元素的离子。元素和同位素组成的高分辨率测量需要确定这些高能离子的入射角,以校正仪器中检测器的光程变化。倾斜角度检测传感器(ADIS)系统是一种简单的检测器配置,用于确定空间仪器中重离子的入射角。 ADIS用简单,可靠和坚固的检测器系统取代了复杂的位置检测检测器(PSD),该检测器相对于仪器轴线倾斜。因此,ADIS仪器在质量,功率,遥测和成本方面具有明显的优势。 2008年2月,改进的ADIS原型在国家超导回旋加速器实验室(NSCL)的耦合回旋加速器设施(CCF)上以150 MeV / u〜(78)Kr束进行了测试。这表明在Kr(Z ​​= 36)时,电荷分辨率为ρ〜0.3 e,这对于这种简单的仪器系统来说是非常出色的电荷分辨率。

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