Single-shot electro-optic experiments for electron bunch diagnostics at Tsinghua Accelerator Laboratory

摘要

The electro-optic (EO) technique detects the Coulomb electric field distribution of relativistic electron bunches to obtain the associated longitudinal profile. This diagnostic method allows the direct time-resolved single-shot measurement and thus the real-time monitoring of the bunch profile and beam arrival time in a non-destructive way with sub-picosecond temporal resolution. In this paper, we report the measurement of the longitudinal profile of an electron bunch through electro-optic spectral decoding detection, in which the bunch profile is encoded into the spectra of the linearly chirped laser pulse. The experimental setup and measurement results of a 40 MeV electron bunch are presented, with a temporal profile length of 527 fs rms (～1.24 ps FWHM) and a beam arrival time jitter of 471 fs rms. Temporal resolution and future experimental improvement are also discussed.