Application of the differential decay-curve method to γ-γ fast-timing lifetime measurements

摘要

A new procedure for the analysis of delayed-coincidence lifetime experiments focused on the Fast-timing case is proposed following the approach of the Differential decay-curve method. Examples of application of the procedure on experimental data reveal its reliability for lifetimes even in the sub-nanosecond range. The procedure is expected to improve both precision/reliability and treatment of systematic errors and scarce data as well as to provide an option for cross-check with the results obtained by means of other analyzing methods.