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机译:Xilinx Zynq-7010片上系统中的软错误评估和漏洞分析
School of Nuclear Science and Technology, Xi'an Jiaotong University, Xian 710049, China;
School of Nuclear Science and Technology, Xi'an Jiaotong University, Xian 710049, China;
School of Nuclear Science and Technology, Xi'an Jiaotong University, Xian 710049, China;
School of Nuclear Science and Technology, Xi'an Jiaotong University, Xian 710049, China;
School of Nuclear Science and Technology, Xi'an Jiaotong University, Xian 710049, China;
School of Nuclear Science and Technology, Xi'an Jiaotong University, Xian 710049, China;
School of Nuclear Science and Technology, Xi'an Jiaotong University, Xian 710049, China;
System on Chip (SoC); Soft error rate; Fault tree analysis; Reliability;
机译:Xilinx Zynq-7010片上系统中单事件影响低能质子的敏感性
机译:Xilinx Zynq-7000片上系统中的软错误敏感块分析
机译:Xilinx Zynq-7000系统软误差敏感块分析
机译:Xilinx UltraScale软错误缓解(SEM IP)工具的单事件翻转特性与评估
机译:修复软件漏洞和配置错误
机译:片上系统(SoC)的参数密集立体视觉实现
机译:在多级缓存层次结构中评估对软错误的应用程序漏洞
机译:通过误差分析评估软件开发。建筑研究设施的数据。