Characterization method to achieve simultaneous absolute PDE measurements of all pixels of an ASTRI Mini-Array camera tile

摘要

Recently, the Istituto Nazionale di Astrofisica (INAF) has placed a contract with Hamamatsu Photonics to acquire hundreds of Silicon Photomultipliers (SiPM) tiles to build 10 cameras with 37 tiles each for the ASTRI Mini-Array (MA) project. Each tile is made up of 8 × 8 pixels of 7 × 7 mm~2 with micro-cells of 75 μm. To check the quality of the delivered tiles a complex and accurate test plan has been studied. The possibility to simultaneously analyse as many pixels as possible becomes of crucial importance. Dark Count Rate (DCR) versus over-voltage and versus temperature and Optical Cross Talk (OCT) versus over-voltage can be easily measured simultaneously for all pixels because they are carried out in dark conditions. On the contrary, simultaneous Photon Detection Efficiency (PDE) measurement of all pixels of a tile is not easily achievable and needs an appropriate optical set-up. Simultaneous measurements have the advantage of speeding up the entire procedure and enabling quick PDE comparison of all the tile pixels. The paper describes the preliminary steps to guarantee an accurate absolute PDE measurement and the investigation the capability of the electronics to obtain simultaneous PDE measurements. It also demonstrates the possibility of using a calibrated SiPM as reference detector instead of a calibrated photodiode. The method to achieve accurate absolute PDE of four central pixels of a tile is also described.