DEPFET pixel detector in the Belle Ⅱ experiment

Abudinen F.; Ackermann K.; Ahlburg P.; Albalawi M.; Alonso O.; Andricek L.; Ayad R.; Babu V; Bai Y.; Bilka T.; Blanco R.; Boronat M.; Bozek A.; Camien C.; Caldwell A.; Chekelian V; Deschamps B.; Dieguez A.; Dingfelder J.; Dolezal Z.; Esperante D.; Fras M.; Frey A.; Fuster J.; Gabriel M.; Gadow K.; Gebauer U.; Germic L.; Gessler T.; Getzkow D.; Gioi L.; Gomis P.; Heck M.; Hemperek T.; Hensel M.; Hoek M.; Kandra J.; Kapusta P.; Kiesling C.; Kisielewski B.; Kittlinger D.; Klose D.; Kodys P.; Koffmane C.; Konorov I; Krivokuca S.; Krueger H.; Kuhr T.; Kuehn W.; Kvasnicka P.; Lacasta C.; Lange J. S.; Lautenbach K.; Leis U.; Leitl P.; Levit D.; Liemann G.; Liu Z.; Luetticke F.; Macharski L.; Marinas C.; Mccarney S.; Moser H. G.; Moya D.; Mueller F. J.; Mueller F.; Muenchow D.; Niebuhr C.; Ninkovic J.; Packheiser U.; Paschen B.; Paul S.; Peric I; Poblotzki F.; Rabusov A.; Reiter S. P.; Richter R.; Ritter M.; Ritzert M.; Rummel S.; Sanchez J. G.; Scavino B.; Schaller G.; Schnecke M.; Schopper F.; Schreeck H.; Schwenker B.; Sedlmeyer R.; Sfienti C.; Simon F.; Skambraks S.; Soloviev Y.; Spruck B.; Stever R.; Stolzenberge U.; Takahashi M.; Tafelmayer E.; Vila I; Virto A. L.; Vogt S.; Vos M.; Wang C.; Wermes N.; Wessel C.; Wieduwilt P.; Windel H.; Ye H.; Zhao J.

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DEPFET pixel detector in the Belle Ⅱ experiment

机译：DEPFET像素探测器在BELLEⅡ实验中

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摘要

The Belle II experiment will run with a reduced beam asymmetry and a factor of 40 higher instantaneous luminosity compared to the Belle experiment. To cope with this and to be able to perform high precision vertex measurements for charge conjugation parity violating processes, a pixel detector based on DEPFET technology will be installed in the center of Belle II. Its basic properties and the DAQ chain are presented in this article.

机译：与Belle实验相比，Belle II实验将用减小的光束不对称和40个瞬时亮度的因子运行。为了应对这一点，并且能够对电荷共轭截面违反过程进行高精度的顶点测量，基于DEPFET技术的像素检测器将安装在Belle II的中心。本文提出了其基本属性和DAQ链。

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《Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment》 |2019年第21期|657-659|共3页
作者
Abudinen F.; Ackermann K.; Ahlburg P.; Albalawi M.; Alonso O.; Andricek L.; Ayad R.; Babu V; Bai Y.; Bilka T.; Blanco R.; Boronat M.; Bozek A.; Camien C.; Caldwell A.; Chekelian V; Deschamps B.; Dieguez A.; Dingfelder J.; Dolezal Z.; Esperante D.; Fras M.; Frey A.; Fuster J.; Gabriel M.; Gadow K.; Gebauer U.; Germic L.; Gessler T.; Getzkow D.; Gioi L.; Gomis P.; Heck M.; Hemperek T.; Hensel M.; Hoek M.; Kandra J.; Kapusta P.; Kiesling C.; Kisielewski B.; Kittlinger D.; Klose D.; Kodys P.; Koffmane C.; Konorov I; Krivokuca S.; Krueger H.; Kuhr T.; Kuehn W.; Kvasnicka P.; Lacasta C.; Lange J. S.; Lautenbach K.; Leis U.; Leitl P.; Levit D.; Liemann G.; Liu Z.; Luetticke F.; Macharski L.; Marinas C.; Mccarney S.; Moser H. G.; Moya D.; Mueller F. J.; Mueller F.; Muenchow D.; Niebuhr C.; Ninkovic J.; Packheiser U.; Paschen B.; Paul S.; Peric I; Poblotzki F.; Rabusov A.; Reiter S. P.; Richter R.; Ritter M.; Ritzert M.; Rummel S.; Sanchez J. G.; Scavino B.; Schaller G.; Schnecke M.; Schopper F.; Schreeck H.; Schwenker B.; Sedlmeyer R.; Sfienti C.; Simon F.; Skambraks S.; Soloviev Y.; Spruck B.; Stever R.; Stolzenberge U.; Takahashi M.; Tafelmayer E.; Vila I; Virto A. L.; Vogt S.; Vos M.; Wang C.; Wermes N.; Wessel C.; Wieduwilt P.; Windel H.; Ye H.; Zhao J.;
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Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

Univ Bonn D-53115 Bonn Germany;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

Univ Barcelona C Marti Franques 1 Barcelona 08028 Spain;

Halbleiterlab Max Planck Gesell Otto Hahn Ring 6 D-81739 Munich Germany;

Univ Tabuk Fac Sci Dept Phys Tabuk 71451 Saudi Arabia;

DESY D-22607 Hamburg Germany;

Tech Univ Munich Arcisstr 21 D-80333 Munich Germany;

Charles Univ Prague Fac Math & Phys Prague 12116 Czech Republic;

Karlsruhe Inst Technol Hermannvon Helmholtz Pl 1 D-76344 Karlsruhe Germany;

UVEG IFIC CSIC Edificio Inst Invest Apartado Correos 22085 E-46071 Valencia Spain;

H Niewodniczanski Inst Nucl Phys PL-31342 Krakow Poland;

DESY D-22607 Hamburg Germany;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

Univ Bonn D-53115 Bonn Germany;

Univ Barcelona C Marti Franques 1 Barcelona 08028 Spain;

Univ Bonn D-53115 Bonn Germany;

Charles Univ Prague Fac Math & Phys Prague 12116 Czech Republic;

UVEG IFIC CSIC Edificio Inst Invest Apartado Correos 22085 E-46071 Valencia Spain;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

Georg August Univ Gottingen Phys Inst 2 D-37073 Gottingen Germany;

UVEG IFIC CSIC Edificio Inst Invest Apartado Correos 22085 E-46071 Valencia Spain;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

DESY D-22607 Hamburg Germany;

Georg August Univ Gottingen Phys Inst 2 D-37073 Gottingen Germany;

Univ Bonn D-53115 Bonn Germany;

Justus Liebig Univ Giessgen D-35392 Giessen Germany;

Justus Liebig Univ Giessgen D-35392 Giessen Germany;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

UVEG IFIC CSIC Edificio Inst Invest Apartado Correos 22085 E-46071 Valencia Spain;

Karlsruhe Inst Technol Hermannvon Helmholtz Pl 1 D-76344 Karlsruhe Germany;

Univ Bonn D-53115 Bonn Germany;

Halbleiterlab Max Planck Gesell Otto Hahn Ring 6 D-81739 Munich Germany;

Johannes Gutenberg Univ Mainz D-55099 Mainz Germany;

Charles Univ Prague Fac Math & Phys Prague 12116 Czech Republic;

H Niewodniczanski Inst Nucl Phys PL-31342 Krakow Poland;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

H Niewodniczanski Inst Nucl Phys PL-31342 Krakow Poland;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

Halbleiterlab Max Planck Gesell Otto Hahn Ring 6 D-81739 Munich Germany;

Charles Univ Prague Fac Math & Phys Prague 12116 Czech Republic;

Halbleiterlab Max Planck Gesell Otto Hahn Ring 6 D-81739 Munich Germany;

Tech Univ Munich Arcisstr 21 D-80333 Munich Germany;

Halbleiterlab Max Planck Gesell Otto Hahn Ring 6 D-81739 Munich Germany;

Univ Bonn D-53115 Bonn Germany;

Ludwig Maximilians Univ Munchen D-80539 Munich Germany;

Justus Liebig Univ Giessgen D-35392 Giessen Germany;

Charles Univ Prague Fac Math & Phys Prague 12116 Czech Republic;

UVEG IFIC CSIC Edificio Inst Invest Apartado Correos 22085 E-46071 Valencia Spain;

Justus Liebig Univ Giessgen D-35392 Giessen Germany;

Justus Liebig Univ Giessgen D-35392 Giessen Germany;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

Tech Univ Munich Arcisstr 21 D-80333 Munich Germany;

Halbleiterlab Max Planck Gesell Otto Hahn Ring 6 D-81739 Munich Germany;

Chinese Acad Sci Inst High Energy Phys 19B Yuquan Rd Beijing Peoples R China;

Univ Bonn D-53115 Bonn Germany;

DESY D-22607 Hamburg Germany;

Univ Bonn D-53115 Bonn Germany;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

Inst Fis Cantabria CSIC UC Avd Castros S-N Santander 39005 Spain;

DESY D-22607 Hamburg Germany;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

Justus Liebig Univ Giessgen D-35392 Giessen Germany;

DESY D-22607 Hamburg Germany;

Halbleiterlab Max Planck Gesell Otto Hahn Ring 6 D-81739 Munich Germany;

DESY D-22607 Hamburg Germany;

Univ Bonn D-53115 Bonn Germany;

Tech Univ Munich Arcisstr 21 D-80333 Munich Germany;

Karlsruhe Inst Technol Hermannvon Helmholtz Pl 1 D-76344 Karlsruhe Germany;

DESY D-22607 Hamburg Germany;

Tech Univ Munich Arcisstr 21 D-80333 Munich Germany;

Justus Liebig Univ Giessgen D-35392 Giessen Germany;

Halbleiterlab Max Planck Gesell Otto Hahn Ring 6 D-81739 Munich Germany;

Ludwig Maximilians Univ Munchen D-80539 Munich Germany;

Heidelberg Univ Inst Comp Engn D-69117 Heidelberg Germany;

Ludwig Maximilians Univ Munchen D-80539 Munich Germany;

Inst Fis Cantabria CSIC UC Avd Castros S-N Santander 39005 Spain;

Johannes Gutenberg Univ Mainz D-55099 Mainz Germany;

Halbleiterlab Max Planck Gesell Otto Hahn Ring 6 D-81739 Munich Germany;

Halbleiterlab Max Planck Gesell Otto Hahn Ring 6 D-81739 Munich Germany;

Halbleiterlab Max Planck Gesell Otto Hahn Ring 6 D-81739 Munich Germany;

Georg August Univ Gottingen Phys Inst 2 D-37073 Gottingen Germany;

Georg August Univ Gottingen Phys Inst 2 D-37073 Gottingen Germany;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

Johannes Gutenberg Univ Mainz D-55099 Mainz Germany;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

DESY D-22607 Hamburg Germany;

Johannes Gutenberg Univ Mainz D-55099 Mainz Germany;

DESY D-22607 Hamburg Germany;

Georg August Univ Gottingen Phys Inst 2 D-37073 Gottingen Germany;

DESY D-22607 Hamburg Germany;

Halbleiterlab Max Planck Gesell Otto Hahn Ring 6 D-81739 Munich Germany;

Inst Fis Cantabria CSIC UC Avd Castros S-N Santander 39005 Spain;

Inst Fis Cantabria CSIC UC Avd Castros S-N Santander 39005 Spain;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

UVEG IFIC CSIC Edificio Inst Invest Apartado Correos 22085 E-46071 Valencia Spain;

Chinese Acad Sci Inst High Energy Phys 19B Yuquan Rd Beijing Peoples R China;

Univ Bonn D-53115 Bonn Germany;

Univ Bonn D-53115 Bonn Germany;

Georg August Univ Gottingen Phys Inst 2 D-37073 Gottingen Germany;

Max Planck Inst Phys & Astrophys D-80805 Munich Germany;

DESY D-22607 Hamburg Germany;

Chinese Acad Sci Inst High Energy Phys 19B Yuquan Rd Beijing Peoples R China;

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关键词
Solid state detectors-poster session; Tracking detectors; Pixel detectors; Silicon detectors; DEPFET; Belle II;

机译：固态探测器 - 海报会话;跟踪探测器;像素探测器;硅探测器;DEPFET;BELLE II;

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专利

1. DEPFET pixel detector in the Belle Ⅱ experiment [J] . Abudinen F., Ackermann K., Ahlburg P., Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment . 2019,第AUGa21期

机译：BelleⅡ实验中的DEPFET像素检测器
2. The ultralight DEPFET pixel detector of the Belle Ⅱ experiment [J] . Florian Luetticke Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment . 2017,第feba11期

机译：BelleⅡ实验的超轻DEPFET像素检测器
3. The DEPFET pixel detector for the Belle II experiment at SuperKEKB [J] . P. Kody? on behalf of DEPFET collaboration Journal of instrumentation: an IOP and SISSA journal . 2015,第2期

机译：SuperKEKB的Belle II实验的DEPFET像素检测器
4. Characterization and Beam Test of the first full-sized DEPFET Modules for the Belle II Pixel Detector PXD [C] . B. Paschen IEEE Nuclear Science Symposium . 2016

机译：Belle II像素检测器PXD的第一全尺寸DEPFET模块的表征和光束测试
5. Determination of the Gyro-electric Reflection and Transmission Coefficients in the Fused Quartz iTOP Cherenkov Particle ID Detectors at the Belle II Experiment [D] . Jeandron, Michael. 2020

机译：熔融石英ITOP Cherenkov粒子ID探测器中陀螺电反射和透射系数的测定在Belle II实验中的探测器
6. The DEPFET Sensor-Amplifier Structure: A Method to Beat 1/f Noise and Reach Sub-Electron Noise in Pixel Detectors [O] . Gerhard Lutz, Matteo Porro, Stefan Aschauer, 2016

机译：DEPFET传感器-放大器结构：一种克服1 / f噪声并达到像素检测器中次电子噪声的方法
7. DEPFET Pixels as a Vertex Detector for the Belle II Experiment [O] . Jochen Schieck for the DEPFET Collaboration 2013

机译：DEpFET像素作为Belle II实验的顶点检测器

DEPFET pixel detector in the Belle Ⅱ experiment

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