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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment >Design and realization of a sputter deposition system for the in situ and in operando use in polarized neutron reflectometry experiments: Novel capabilities
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Design and realization of a sputter deposition system for the in situ and in operando use in polarized neutron reflectometry experiments: Novel capabilities

机译:极化中子反射测量实验中原位和操作中溅射沉积系统的设计与实现:新颖的功能

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Recently, the design and realization of a sputter-deposition system for in situ and in operando polarized neutron reflectometry (PNR) was reported. The device allows magnetic thin films and heterostructures to be grown, while the sample remains aligned in the neutron beam for PNR. By now, it has been applied in experiments that investigated the magnetic and structural properties of thin Fe and Pd/Fe/Pd heterostructures as a function of the layer thickness. Here, we report on significant upgrades of the deposition system with advanced thin film growth and measurement capabilities. These include improvements to the generation of the vacuum to realize ultra-high-vacuum (UHV) conditions. A base pressure below 5 ×10~(-9) mbar can now be obtained within less than one day of pumping time. To allow experiments over a wide range of temperatures, the system was upgraded to include a cryo-furnace. It allows the sample to be cooled or heated in the range of 10 K to 1000 K for both applications, sample growth and measurement. Further, a new magnetic coil setup with soft iron yoke was designed which can realize a homogeneous in-plane magnetic field of up to 300 mT and electric fields at the sample position.
机译:近来,已经报道了用于原位和操作偏振极化中子反射仪(PNR)的溅射沉积系统的设计和实现。该设备可以生长磁性薄膜和异质结构,而样品在PNR的中子束中保持对准。到目前为止,它已用于研究薄Fe和Pd / Fe / Pd异质结构随层厚度变化的磁性和结构性能的实验中。在这里,我们报告了具有先进薄膜生长和测量功能的沉积系统的重大升级。其中包括改进真空的产生以实现超高真空(UHV)条件。现在可以在不到一天的抽水时间内获得低于5×10〜(-9)mbar的基本压力。为了允许在较宽的温度范围内进行实验,该系统已升级为包括一个低温炉。它允许样品在10 K至1000 K的范围内进行冷却或加热,以用于样品的生长和测量。此外,设计了一种新的带有软铁轭的电磁线圈装置,该线圈可以实现高达300 mT的均匀面内磁场和样品位置处的电场。

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