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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research >Characterization of monolithic CMOS pixel sensor chip with ion beams for application in particle computed tomography
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Characterization of monolithic CMOS pixel sensor chip with ion beams for application in particle computed tomography

机译:带有离子束的单片CMOS像素传感器芯片的表征,用于粒子计算机断层摄影

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Particle computed tomography (pCT) is an emerging imaging modality that promises to reduce range uncertainty in particle therapy. The Bergen pCT collaboration aims to develop a novel pCT prototype based on the ALPIDE monolithic CMOS sensor. The planned prototype consist of two tracking planes forming a rear tracker and Digital Tracking Calorimeter (DTC). The DTC will be made of a 41 layer ALPIDE-aluminum sandwich structure. To enable data acquisition at clinical particle rates, a large multiplicity of particles will be measured using the highly-granular ALPIDE sensor. In this work, a first characterization of the ALPIDE sensor performance in ion beams is conducted. Particle hits in the ALPIDE sensor result in charge clusters whose size is related to the chip response and the particle energy deposit. Firstly, measurements in a 10 MeV ~4He micro beam have been conducted at the SIRIUS microprobe facility of ANSTO to investigate the dependence of the cluster size on the beam position over the ALPIDE pixel. Here, a variation in cluster size depending on the impinging point of the beam was observed. Additional beam tests were conducted at the Heidelberg Ion-Beam Therapy Center (HIT) investigating the cluster size as a function of the deposited energy by protons and ~4He ions in the sensitive volume of the ALPIDE. Results show the expected increase in cluster sizes with deposited energy and a clear difference in cluster sizes for protons and 4He ions. As a conclusion, the variation in cluster size with the impinging point of the beam has to be accounted for to enable accurate energy loss reconstruction with the ALPIDE. This does, however, not affect the tracking of particles through the final prototype, as for that only the center-of-mass of the cluster is relevant.
机译:粒子计算机断层扫描(pCT)是一种新兴的成像方式,有望减少粒子治疗中的范围不确定性。卑尔根pCT合作旨在基于ALPIDE单片CMOS传感器开发新颖的pCT原型。计划中的原型机由两个跟踪飞机组成,它们构成一个后跟踪器和一个数字跟踪量热仪(DTC)。 DTC将由41层ALPIDE-铝三明治结构制成。为了能够以临床颗粒速率进行数据采集,将使用高度颗粒化的ALPIDE传感器测量大量颗粒。在这项工作中,对离子束中ALPIDE传感器的性能进行了首次表征。 ALPIDE传感器中的粒子撞击会导致电荷簇,其大小与芯片响应和粒子能量沉积有关。首先,已经在ANSTO的SIRIUS微探针设备上进行了10 MeV〜4He的微束测量,以研究簇尺寸对ALPIDE像素上束位置的依赖性。在此,观察到簇尺寸随光束的入射点而变化。在海德堡离子束治疗中心(HIT)进行了额外的射束测试,研究了簇尺寸与质子和〜4He离子在ALPIDE敏感体积中沉积的能量的函数关系。结果表明,随着沉积能量的增长,簇尺寸的预期增加,质子和4He离子簇尺寸的明显差异。结论是,必须考虑簇大小随光束撞击点的变化,以利用ALPIDE进行准确的能量损失重建。但是,这不会影响通过最终原型进行的粒子跟踪,因为只有簇的质心才是相关的。

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