机译:MEGⅡ正电子定时计数器的6种串联SiPM的辐射损伤对时间分辨率的影响
Univ Tokyo, Bunkyo Ku, 7-3-1 Hongo, Tokyo 1130033, Japan;
INFN, Sez Pavia, Via A Bassi 6, I-27100 Pavia, Italy|Univ Pavia, Dipartimento Fis, Via A Bassi 6, I-27100 Pavia, Italy;
INFN, Sez Pavia, Via A Bassi 6, I-27100 Pavia, Italy;
INFN, Sez Genova, Via Dodecaneso 33, I-16146 Genoa, Italy;
INFN, Sez Genova, Via Dodecaneso 33, I-16146 Genoa, Italy|Univ Genoa, Dipartimento Fis, Via Dodecaneso 33, I-16146 Genoa, Italy;
Univ Tokyo, Bunkyo Ku, 7-3-1 Hongo, Tokyo 1130033, Japan;
Univ Tokyo, Bunkyo Ku, 7-3-1 Hongo, Tokyo 1130033, Japan;
Univ Tokyo, Bunkyo Ku, 7-3-1 Hongo, Tokyo 1130033, Japan;
INFN, Sez Pavia, Via A Bassi 6, I-27100 Pavia, Italy;
Univ Tokyo, Bunkyo Ku, 7-3-1 Hongo, Tokyo 1130033, Japan;
Series connection of SiPMs; Radiation damage effect; Time resolution;
机译:辐射损伤对MEGⅡ正电子正式计数器6系列连接SIPMS的时间分辨率
机译:MEG II中完整的正电子定时计数器系统,时间分辨率低于40 ps,SiPM可以快速读取塑料闪烁体
机译:通过串联连接的辐射损坏的SIPM读出塑料闪烁体计数器的定时分辨率
机译:辐射硬度试验与时序计数器egii sipms的中子
机译:飞行时间正电子排放断层扫描(TOF-PET)电离辐射检测的新机制:光学性质和Cherenkov发光的调节
机译:使用涂覆有荧光粉的晶体和高密度硅光电倍增管在飞行时间和相互作用深度的正电子发射断层成像检测器中达到200 ps的定时分辨率
机译:与SIPM读数闪烁器的像素化正电子正常计数器用于MEG II实验