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Neutron irradiation effect on SiPMs up to Φ_(neq) = 5 × 10~(14) cm~(-2)

机译:中子辐照对Φ_(neq)= 5×10〜(14)cm〜(-2)的SiPM的影响

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Silicon Photo-Multipliers (SiPM) are becoming the photo-detector of choice for increasingly more particle detection applications, from fundamental physics, to medical and societal applications. One major consideration for their use at high-luminosity colliders is the radiation damage induced by hadrons, which leads to a dramatic increase of the dark count rate. KETEK SiPMs have been exposed to various fluences of reactor neutrons up to Phi(neq)= 5 x 10(14) cm(-2) (1 MeV equivalent neutrons). Results from the I-V, and C-V measurements for temperatures between - 30 degrees C and + 30 degrees C are presented. We propose a new method to quantify the effect of radiation damage on the SiPM performance. Using the measured dark current the single pixel occupation probability as a function of temperature and excess voltage is determined. From the pixel occupation probability the operating conditions for given requirements can be optimized. The method is qualitatively verified using current measurements with the SiPM illuminated by blue LED light. (C) 2017 Elsevier B.V. All rights reserved.
机译:硅光电倍增管(SiPM)成为越来越多的粒子检测应用(从基础物理学到医学和社会应用)的首选光电检测器。在高亮度对撞机上使用它们的一个主要考虑因素是强子引起的辐射损伤,这导致暗计数率急剧增加。 KETEK SiPMs已暴露于反应堆中子的各种通量,最高可达Phi(neq)= 5 x 10(14)cm(-2)(1 MeV当量中子)。给出了温度在-30摄氏度和+ 30摄氏度之间的I-V和C-V测量结果。我们提出了一种新的方法来量化辐射损伤对SiPM性能的影响。使用测得的暗电流,确定作为温度和过电压的函数的单个像素占用概率。根据像素占用概率,可以优化给定要求的工作条件。该方法已通过使用蓝色LED灯照亮的SiPM的电流测量进行了定性验证。 (C)2017 Elsevier B.V.保留所有权利。

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