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Pressure driven high-n/high-m tearing modes in low shear regions with high pressure gradients and high resistivity

机译:在低剪切区中具有高压梯度和高电阻率的压力驱动的高n /高-m撕裂模式

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摘要

High-n modes near q=1 observed in ASDEX Upgrade discharges with high impurity accumulation have been shown to be tearing modes. High-n tearing are usually stable; however, owing to high current gradient and low shear they become unstable. The coupling of different poloidal harmonics due to toroidal geometry and plasma shaping supports the mode growth. Changes in the pressure alter the relationship between the various sideband harmonics within one mode even to the extent that its tearing character may be destroyed.
机译:在ASDEX中观察到q == 1附近的高n模式出现了具有高杂质积累的升级放电模式。高n撕裂通常是稳定的;然而,由于高电流梯度和低剪切,它们变得不稳定。由于环形几何形状和等离子体整形而产生的不同的倍性谐波的耦合支持了模增长。压力的变化会改变一种模式内各种边带谐波之间的关系,甚至会破坏其撕裂特性。

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