首页> 外文期刊>Journal of Communications Technology and Electronics >320 x 256 avalanche array photodetector on the basis of ternary alloys of the A(3)B(5) group with an InGaAs absorbing layer and an InAlAs barrier layer
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320 x 256 avalanche array photodetector on the basis of ternary alloys of the A(3)B(5) group with an InGaAs absorbing layer and an InAlAs barrier layer

机译:320 x 256雪崩阵列光电探测器,基于具有InGaAs吸收层和InAlAs阻挡层的A(3)B(5)组三元合金

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摘要

320 x 256 avalanche array photodetector on the basis ternary alloys of the A(3)B(5) group with an InGaAs absorbing (in the band of 0.9-1.7 mu m) layer and InAlAs barrier layer is studied. The array of 320 x 256 elements was fabricated in a nBp nanoheterostructure by the mesa technology. The number of imperfect elements, the dependence of the dark current on the bias voltage, and the avalanche gain factor are measured.
机译:研究了基于A(3)B(5)基团的三元合金与InGaAs吸收层(在0.9-1.7μm范围内)和InAlAs阻挡层的三元合金的320 x 256雪崩阵列光电探测器。通过台面技术,在nBp纳米异质结构中制造了320 x 256个元素的阵列。测量不完美元件的数量,暗电流对偏置电压的依赖性以及雪崩增益系数。

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