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Fan-in analysis of a leaky integrator circuit using charge transfer synapses

机译:使用电荷转移突触对泄漏积分器电路进行扇入分析

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It is shown that a simple leaky integrator (LI) circuit operating in a dynamic mode can allow spatial and temporal summation of weighted synaptic outputs. The circuit incorporates a current mirror configuration to sum charge packets released from charge transfer synapses and an n-channel MOSFET, operating in subthreshold, serves to implement a leakage capability, which sets the decay time for the postsynaptic response. The focus of the paper is to develop an analytical model for fan-in and validate the model against simulation and experimental results obtained from a prototype chip fabricated in the AMS 0.35 mu m mixed signal CMOS technology. We show that the model predicts the theoretical limit on fan-in, relates the magnitude of the postsynaptic response to weighted synaptic inputs and captures the transient response of the LI when stimulated with spike inputs. (C) 2018 Elsevier B.V. All rights reserved.
机译:结果表明,在动态模式下运行的简单泄漏积分器(LI)电路可允许加权突触输出的时空求和。该电路集成了电流镜配置,可对从电荷转移突触释放的电荷包进行求和,并且亚阈值下工作的n沟道MOSFET用于实现泄漏能力,该能力设置了突触后响应的衰减时间。本文的重点是开发用于扇入的分析模型,并针对通过AMS 0.35微米混合信号CMOS技术制造的原型芯片获得的仿真结果和实验结果验证该模型。我们表明,该模型可预测扇入的理论极限,将突触后反应的幅度与加权突触输入相关,并在受到尖峰输入刺激时捕获LI的瞬态响应。 (C)2018 Elsevier B.V.保留所有权利。

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