Photoelectric performance analysis of infrared detector based on image processing

摘要

At present, the photoelectric performance of infrared detectors has been effectively improved, but the research on photoelectric performance is still less and there is a lack of stable evaluation methods. In order to improve the efficiency of evaluating the photoelectric performance of infrared detectors this study constructed an effective infrared detector test system and combined the infrared detection principle and image processing technology to improve the algorithm. According to the characteristics of infrared images, the image processing technology used in defect detection is mainly image segmentation technology, which effectively segments the recognition image and clearly displays the feature parts. In addition, this study design test to analyze the effectiveness of the method proposed in this study. The research results show that the proposed algorithm has certain effects and can provide theoretical reference for subsequent related research.