In Situ X-Ray-Diffraction Stuidies of Passive Oxide Films

摘要

In addition to solving the decades-old question about the passive-film struc- ture, our results have other implications, Since the corrosion resistance of the pas- Sive film is influenced by its ionic and Electronic transport properties, which Are largely determined by the film's crys- Tallographic structure and its defects and Microstructure, our explicit description Of these parameters opens the way to de- Tailed modeling of these transport prop- Erties.