Reliability assessment for particle-induced failures in multi-generation hard disk drives

著录项

• 来源
  《Microsystem Technologies 》 |2007年第10期| 891-894| 共4页
• 作者

  Loon-Ching Tang; Quock Y. Ng; Wee-Tat Cheong; Jing-Shi Goh;

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• 作者单位

  Faculty of Engineering Department of Industrial and Systems National University of Singapore 10 Kent Ridge Crescent Singapore 119260 Singapore;

  Seagate Technology International 63 The Fleming Science Park Drive Singapore 118249 Singapore;

  Faculty of Engineering Department of Industrial and Systems National University of Singapore 10 Kent Ridge Crescent Singapore 119260 Singapore;

  Seagate Technology International 63 The Fleming Science Park Drive Singapore 118249 Singapore;

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• 正文语种 eng
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