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首页> 外文期刊>The microscope >Polarized Light Microscopy for Determining the Principal Refractive Indices of Components in Polished Thin Sections (Part 2 of 2)
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Polarized Light Microscopy for Determining the Principal Refractive Indices of Components in Polished Thin Sections (Part 2 of 2)

机译:偏光显微镜测定抛光薄切片中成分的主要折光指数(第2部分,共2部分)

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摘要

It is now clear why Sorby's (58) RI determinations with a low power objective of 2/3 inch (16.9 mm focal length, corresponding to a magnification of about 10×), were consistently too high by 0.010 for minerals of RI about 1.5 and too high by 0.018 for minerals with a RI of approximately 2.0. Sorby's discrepancy can be attributed to his use of the original Chaulnes equation, which incorrectly assumes a slope of one for the objective. The difference between a hyperbola and a line is still relatively small for a 0.6 NA objective, e.g., when solved for n, Equation 5 is approximately linear for a 0.6 NA objective in the range of RIs encountered, as shown in Figure 2 for the curve of n versus d/s, based on the data in Lawless and Devries (46).
机译:现在很清楚,为什么对于低能量物镜为2/3英寸(焦距为16.9毫米,对应于约10倍的放大倍数)的Sorby(58)RI测定,对于RI约为1.5和1.5的矿物而言,始终高0.010? RI大约为2.0的矿物太高0.018。 Sorby的差异可以归因于他使用原始Chaulnes方程,该方程错误地假设物镜的斜率为1。对于0.6 NA物镜,双曲线和直线之间的差异仍然相对较小,例如,当求解n时,对于遇到NA的RI范围为0.6 NA物镜,方程5近似线性,如图2所示。基于Lawless and Devries(46)中的数据,得出n与d / s的关系。

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  • 来源
    《The microscope》 |2015年第4期|173-187|共15页
  • 作者

    Franz W. Nentwich;

  • 作者单位

    #203 - 123 Doane Street, Ottawa, Ontario, Canada K2B6G7;

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  • 正文语种 eng
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