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Technology mapping for Field Programmable Gate Arrays using Content-Addressable Memory (CAM)

机译:使用内容可寻址存储器(CAM)的现场可编程门阵列的技术映射

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The growing complexity of Field Programmable Gate Arrays (FPGA's) is leading to architectures with high input cardinality look-up tables (LUT's). This paper describes a methodology for area-optimal combinational technology mapping, specifically designed for such FPGA architectures. This methodology, called LURU, leverages the parallel search capabilities of Content-Addressable Memories (CAM's) to outperform traditional mapping algorithms in both execution time and quality of results. The LURU algorithm is fundamentally different from other techniques for technology mapping in that LURU uses textual representations of circuit topology in order to efficiently store and search for circuit patterns in a CAM. A circuit is mapped to the target LUT technology using exact, inexact, or hybrid matching techniques. Common subcircuit expressions (CSE's) are also identified and used for architectural optimization—a small set of CSE's is shown to effectively cover an average of 96% of the test circuits. LURU was tested with the ISCAS '85 suite of combinational benchmark circuits and compared with the mapping algorithms FlowMap and CutMap. The area requirement of LURU's mapping is, on average, 20% less than FlowMap or CutMap. The asymptotic runtime complexity of LURU is shown to be better than that of both FlowMap and CutMap.
机译:现场可编程门阵列(FPGA)的日益复杂性正导致具有高输入基数查找表(LUT)的体系结构。本文介绍了一种专为此类FPGA架构设计的区域最优组合技术映射方法。这种称为LURU的方法论利用了内容可寻址存储器(CAM)的并行搜索功能,在执行时间和结果质量方面均优于传统的映射算法。 LURU算法从根本上不同于其他技术映射技术,因为LURU使用电路拓扑的文本表示来有效地存储和搜索CAM中的电路模式。使用精确,不精确或混合匹配技术将电路映射到目标LUT技术。还可以识别常见的子电路表达式(CSE)并将其用于体系结构优化-示出了一小部分CSE可以有效覆盖平均96%的测试电路。 LURU已通过ISCAS '85组合基准电路套件进行了测试,并与映射算法FlowMap和CutMap进行了比较。 LURU映射的区域需求平均比FlowMap或CutMap少20%。 LURU的渐近运行时复杂度显示出比FlowMap和CutMap都更好。

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