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New experiments on the electrodeposition of iron in porous silicon

机译:铁在多孔硅中电沉积的新实验

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We report here the study about the electrodeposition of iron into porous silicon made in p-type (15-25Ω cm) silicon waferes. Chronoamperometry measurements were performed to show that the iron nucleation does not start only at the bottom of the pores, which is confirmed by the high quality SEM images. The energy band of the heterostructure Si/PS is used to explain the mechanisms involved in the electrodeposition of iron and the porous silicon formation. This new stricture (iron and porous silicon), once well controlled might have an influence on the new device developments.
机译:我们在此报告有关将铁电沉积到以p型(15-25Ωcm)硅片制成的多孔硅中的研究。进行计时安培法测量显示铁成核不仅仅在孔的底部开始,这由高质量的SEM图像证实。异质结构Si / PS的能带用于解释电沉积铁和形成多孔硅的机理。一旦受到良好控制,这种新的结构(铁和多孔硅)可能会对新设备的开发产生影响。

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