We developed a new versatile testing interface that can keep a device in the proper electrical state for defect localization. It makes it possible to configure the circuit by plugging the interface to an electrical tester or a switching matrix. For the applications, this small interface is carried to the emission microscope for light emission, TIVA, and other laser techniques. The circuit can then be analyzed while being in the proper electrical test It offers the advantage of simple connections (e.g.; for a 256 pin count device) and reduced noise compared too long cable connection used between the microscope chamber and the outside.
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