Neutron-induced ~10B fission as a major source of soft errors in high density SRAMs

摘要

The impact of cosmic neutron induced ~10B fission in production submicron SRAM devices is reported for the first time. Using a cold neutron beam to accelerate soft error rate events, we unambiguously demonstrate that neutron induced ~10B fission can be a significant source of soft errors in deep-submicron SRAMs fabricated with borophospho- silicate glass.