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Railure modes of tantalum capacitors made by different technologies

机译:不同技术制造的钽电容器的摆线模式

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摘要

Tantalum capacitor failure modes have been discussed both for the standard manganese dioxide cathode and the new conductive polymer (CP) type. For standard tantalum in the normal operation mode, an electrical breakdown can be stimulated by an increased of the electrical conductance in channel by an electrical pulse or voltage level. This leads to capacitor destruction followed by thermal breakdown. In the reverse mode, we have reported that thermal breakdown is initiated by an increase of the electrical conductance by Joule heating at a relatively low voltage level.
机译:对于标准的二氧化锰阴极和新型导电聚合物(CP)类型,都已经讨论了钽电容器的故障模式。对于处于正常操作模式下的标准钽,电击穿可以通过电脉冲或电压电平增加通道中的电导率来刺激。这导致电容器损坏,随后发生热击穿。在反向模式下,我们已经报道了热击穿是通过在相对较低的电压水平下通过焦耳加热来增加电导率而引发的。

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