The low-frequency noise in the devices often appears to be a superposition of 1/f noise and white noise, which are induced by different physical mechanisms or microscopic defects. The separation of the two noises is necessary espe- cially in the characterization of quality and reliability by means of noise measurement. The traditional separation method is usually used in frequency domain with limited frequency range, and the estimated value of exponent index γ for 1/f~γ noise has considerable error when the ratio of 1/f noise and white noise is smaller than 20 dB.
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