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MAGFET based current sensing for power integrated circuit

机译:基于MAGFET的功率集成电路电流感测

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A new on-chip non-invasive integrated current sensing, compatible with standard CMOS technology, has been developed, using a 1.2 μm BiCMOS ALCATEL technology, to sense the current in the drain side of a power MOSFET. The circuit is based on a split-drain magnetic sensor, implemented on the same chip of an integrated gate driver for a power MOSFET. A CMOS biasing circuit with a differential current output is also developed. The simulation results of the current sensing show a conversion gain of 1.25 mV/mT.
机译:已经开发出一种新的与标准CMOS技术兼容的片上非侵入式集成电流感测技术,该技术使用1.2μmBiCMOS ALCATEL技术来​​感测功率MOSFET漏极侧的电流。该电路基于分流漏磁传感器,在功率MOSFET集成栅极驱动器的同一芯片上实现。还开发了具有差分电流输出的CMOS偏置电路。电流检测的仿真结果表明转换增益为1.25 mV / mT。

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