...
首页> 外文期刊>Microelectronics & Reliability >Polymer film deposition with fine pitch openings by stencil printing
【24h】

Polymer film deposition with fine pitch openings by stencil printing

机译:通过模版印刷沉积具有细间距开口的聚合物膜

获取原文
获取原文并翻译 | 示例

摘要

It is confirmed that stencil printing with a novel developed printable polyimide paste can be used for polymer film deposition on LSI wafers. A thick polyimide film with openings for solder ball bumping can be deposited on all of the LSIs on a wafer by stencil printing at one time. This stencil printing process does not need an expensive lithography process, providing cost-effective wafer-level chip scale packages (WLCSPs). In this study, a novel polyimide paste was tailored to have a higher thixotropy ratio than conventional printable polyimide materials. The novel printable polyimide paste shows that the viscosity ratio of more than 3.5 at the shear rate of 1 to 10 s~(-1) and that the viscosity increases rapidly after the shear rate is lowered. Fine spaces of 40 μm between 250 μm openings were obtained for 10 μm thick polyimide films on Si wafers. It has been also confirmed that the new paste shows the variation range of 30 μm at the opening size of 385 μm within 100 continuously printed wafers. Even after the new paste was shear-thinned repeatedly, rheological behavior of the new paste was not changed. This robustness leads to higher efficiency of the materials for mass-producing. From the reliability viewpoint of the printed polyimide films, no peelings were observed on plasma-CVD SiN films after the pressure cooker test under the condition of 127℃ and 0.25 MPa with the humidity of 100% for 300 h. The optimal stencil printing process using the novel developed paste will lead to significant cost reduction of a patterned polymer deposition process. Finally, WLCSPs using the stencil printing of the new polyimide paste have been demonstrated for SRAM LSIs on 8-in. wafers.
机译:可以肯定的是,采用新型开发的可印刷聚酰亚胺浆料进行的模版印刷可用于在LSI晶片上沉积聚合物膜。通过一次模版印刷,可以在晶片上的所有LSI上沉积一层厚厚的聚酰亚胺膜,该膜具有用于焊球隆起的开口。这种模版印刷工艺不需要昂贵的光刻工艺,从而提供了具有成本效益的晶圆级芯片规模封装(WLCSP)。在这项研究中,一种新型的聚酰亚胺糊料经过定制,具有比常规可印刷聚酰亚胺材料更高的触变性比。新型可印刷的聚酰亚胺糊剂显示出在剪切速率为1至10 s〜(-1)时粘度比大于3.5,并且在降低剪切速率后粘度迅速增加。对于Si晶片上的10μm厚的聚酰亚胺薄膜,在250μm的开口之间可获得40μm的精细空间。还已经证实,在100个连续印刷的晶片中,新的浆料在385μm的开口尺寸下显示出30μm的变化范围。即使在反复剪切稀新浆之后,新浆的流变行为也没有改变。这种坚固性导致更高的批量生产材料效率。从印刷的聚酰亚胺膜的可靠性的观点出发,在127℃,0.25MPa,100%的湿度,300h的条件下进行压力蒸煮试验后,等离子CVD SiN膜没有观察到剥离。使用新型显影浆料的最佳模版印刷工艺将大大降低图案化聚合物沉积工艺的成本。最后,已针对8英寸SRAM LSI演示了使用新型聚酰亚胺浆料的模版印刷的WLCSP。晶圆。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号