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Modified micro-macro thermo-mechanical modelling of ceramic ball grid array packages

机译:陶瓷球栅阵列封装的改进的微宏热力学建模

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The ceramic ball grid array (CBGA) packages are typically used for high I/O count area array assemblies. As the package size is large, the distance to neutral point is also high resulting in a large thermal deformation mismatch between the CBGA package and the printed circuit board (PCB). In order to cope with this problem, a special solder joint connection is used. As CBGA assemblies are used for high pin count assemblies, a full 3D thermo-mechanical modelling of an assembly to an FR4 board is not possible anymore. Therefore, a modified micro-macro methodology is proposed where only the critical solder joint is modelled in detail, while the other connections are replaced by equivalent connections. For several CBGA configurations, simulation results are correlated to thermal cycling test results. Finally, a parameter sensitivity study shows that the PCB properties have a significant influence on the solder joint reliability.
机译:陶瓷球栅阵列(CBGA)封装通常用于高I / O数区域阵列组件。由于封装尺寸较大,到中性点的距离也很高,导致CBGA封装与印刷电路板(PCB)之间的热变形不匹配较大。为了解决这个问题,使用了特殊的焊点连接。由于CBGA组件用于高引脚数的组件,因此不再可能将组件完整地3D热机械建模到FR4板上。因此,提出了一种改进的微宏方法,其中仅对关键焊点进行了详细建模,而其他连接被等效连接代替。对于几种CBGA配置,仿真结果与热循环测试结果相关。最后,一项参数敏感性研究表明,PCB性能对焊点可靠性有重要影响。

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