Time Resolved Photon Emission Processing Flow for IC Analysis

摘要

IC analysis can be facilitated using Time Resolved Photon Emission (TRE). Because recent technologies work at ultra low power supply voltages: < 1V, background noise can mask commutation peaks thus biasing analyses. With a positive photon discrimination flow, signals can be extracted even below the noise level. However signal extraction depends on various parameters (e.g., bin size, cutoff frequency). WE have developed a photon discrimination technique to optimize these parameters. This technique is integrated into a generic method which takes advantage of static light emission acquisition for identifying switching transistors and which links TRE measurements to simulations for optimal IC diagnostics.