Fail / Recover / Fail (F/R/F) failure mechanisms new trend

摘要

The need to improve the failure analysis results accuracy and the cycle time reduction of all the reliability and qualification is a key factor of the success for new products or technologies. The 150℃ bake during the failure analysis process is known to segregate the failure mechanisms. All the recovered units submitted to the reliability test duplication have not the same behavior. The F/R/F (Fail/Recover/Fail) delay failure duplication leads to the failure mechanisms. The study of this delay versus failure mechanisms found during several EFR (Early Failure Rate) exercises is presented.