Magnetic Microscopy for IC Failure Analysis : Comparative Case Studies using SQUID, GMR and MTJ systems

摘要

Magnetic field based techniques have shown great capabilities for investigation of current flows in ICs. After reviewing the performances of SQUID, GMR (hard disk head technologies) and MTJ existing sensors, we will present results obtained on various case studies. This comparison will show the benefit of each approach according to each case study (packaged devices, flip-chip circuits, ...). Finally,Finally, from the obtained results we classify techniques, their optimal domains of application and benefits.