Test generation for technology-specific multi-faults based on detectable perturbations

摘要

In this paper, we introduce the concept of detectable perturbations as a method to generate tests that cover any technology-specific faults such as multiple bridging, open and stuck-at faults. Rather than devising a customized test pattern generation system for each class of technology-specific faults, we implemented a generic system to generate tests for single and multiple perturbations. We demonstrate the versatility of this approach by generating tests for a set of large benchmark circuits that have been mapped into single- and multi-output modules. These tests cover single stuck-at, multi-output bridging, stuck-at, as well as any mutation faults in the functionality of the technology-mapped cells. Experimental results provide useful insights about the quality of single stuck-at test patterns versus coverages for the additional classes of faults.