Physical-to-Logical Mapping of Emission Data using Place-and-Route

摘要

Emission and laser based analysis techniques are becoming a first line of defense for device analysts. Emission data is quickly and easily obtained in order to provide a method to narrow down the search for device defects. Often the defects that produce emission are not located in the area of the emission itself. Deprocessing the device after locating an emission site often results in the true cause of the defect to be lost. The use of design place-and-route data with emission tools can provide information which is critical to the analyst and provide a method to trace from the emission site to the true defect location.