Editorial

摘要

Once again, a special issue of Microelectronics and Reliability is devoted to the publication of the papers presented at ESREF. The 18th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2007, will be held in Arcachon, near Bordeaux (France) from October 8th to October 12th, 2007. This international symposium continues to focus on the latest research developments and future directions in Quality and Reliability Management of materials, devices and circuits for microelectronics. It provides a European forum for developing all aspects of reliability management and the state of practise in advanced analysis techniques for present and future semiconductor applications.