Reliability assessment of the metallized film capacitors from degradation data

摘要

Metallized film pulse capacitors are the key component of an inertial confinement fusion (ICF) facility. The reliability of the capacitors has a significant impact on the operational reliability and maintenance expenses of the entire system. For high-reliability capacitors that do not normally fail in a reasonable length of time, it is difficult to assess reliability by using the traditional time-to-failure analysis method. Analyzing the degradation mechanisms of the metallized film capacitors, this paper presents a life distribution model whose parameters can be estimated from the degradation measures of the capacitors, and which has proven to be very accurate and economical in test costs.