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Transient analysis of drop responses of board-level electronic packages using response spectra incorporated with modal superposition

机译:使用模态叠加结合的响应谱对板级电子封装的跌落响应进行瞬态分析

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摘要

In this paper the response spectra analysis is introduced to obtain transient structural responses of an undamped multiple degrees of freedom structural system subjected to an impact acceleration pulse of a half-sine waveform. The JEDEC drop test condition B is specifically chosen to investigate transient structural responses of a board-level test vehicle comprised of a test board and a mounted package during the drop impact process. Comparisons are made between computed and measured longitudinal strains on the test board as well as time integration and response spectra solutions for stresses in the solder joint.
机译:在本文中,引入响应谱分析以获得在半正弦波形冲击加速度脉冲下无阻尼的多自由度结构系统的瞬态结构响应。专门选择JEDEC跌落测试条件B来研究跌落冲击过程中包括测试板和安装好的封装的板级测试车辆的瞬态结构响应。在测试板上计算和测量的纵向应变以及焊点应力的时间积分和响应谱解决方案之间进行比较。

著录项

  • 来源
    《Microelectronics reliability》 |2007年第12期|2188-2196|共9页
  • 作者单位

    Stress-Reliability Laboratory, Advanced Semiconductor Engineering, Inc., 26 Chin 3rd Rd., Nantze Export Processing Zone, 811 Nantze, Kaohsiung, Taiwan, ROC;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 一般性问题;
  • 关键词

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