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Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits

机译:静态Si CCD中动态光子发射的可检测性,用于确定集成电路中的信号路径

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The detection of dynamic photon emission by static cameras is an inexpensive approach to track circuit signal paths, but successful application depends on the signal pattern and frequency the devices are operating at. For improvement of predictability, a model has been developed, built upon the composition of operating modes and targeted to calculate the static emission signal. On single transistor test structures, the model is verified and an operating frequency correlates to the detection limit. Ring oscillator results confirm that only a fraction of the inverter switching time is accompanied by photon emission. At a real circuit it is demonstrated that operating condition limits for signal path detection in static photon emission detectors can be defined.
机译:静态照相机检测动态光子发射是跟踪电路信号路径的一种廉价方法,但是成功的应用取决于设备工作的信号模式和频率。为了提高可预测性,已经开发了一种模型,该模型建立在运行模式的组成基础上,旨在计算静态发射信号。在单晶体管测试结构上,对模型进行验证,并且工作频率与检测极限相关。环形振荡器的结果证实,只有逆变器切换时间的一小部分伴随着光子发射。在实际电路中,证明了可以定义静态光子发射检测器中信号路径检测的工作条件限制。

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