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Packaging influences on the reliability of MEMS resonators

机译:封装对MEMS谐振器可靠性的影响

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摘要

In this paper, the effect of assembly processes on the reliability of MEMS resonators is investigated. The common functions of MEMS resonators in the current technology are described as well as the most common designs. Virtual prototyping of a resonator during several assembly steps is used to estimate their influence. Experiments are executed in order to verify the simulation results. These experiments are also used to find yet unknown failure modes.
机译:本文研究了组装工艺对MEMS谐振器可靠性的影响。描述了当前技术中MEMS谐振器的常见功能以及最常见的设计。在几个组装步骤中,谐振器的虚拟原型被用来估计它们的影响。为了验证仿真结果,进行了实验。这些实验还用于查找未知的故障模式。

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