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FPGA-based switch-level fault emulation using module-based dynamic partial reconfiguration

机译:使用基于模块的动态部分重新配置的基于FPGA的开关级故障仿真

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In order to design a fault tolerant digital system, it is necessary to understand its behavior with the presence of faults in early design stage. Fault simulation is a process to purposely inject faults into a software circuit model and observe its faulty behavior. However, such simulation's runtime tends to grow exponentially when test circuit becomes large. FPGA-based fault emulation, which is fault simulation implemented in FPGA, is an efficient way to accelerate fault simulation process. This paper introduces a novel FPGA-based switch-level fault emulation system utilizing module-based dynamic partial reconfiguration. In this approach, faults are modeled at switch-level and mapped to gate-level description for efficient FPGA implementation. The circuit under test is partitioned using unbalanced partitioning structure so that faults are injected only in a small sub-circuit. Using module-based dynamic partial reconfiguration, faulty circuit partition can be downloaded to FPGA without erasing the fault-free part of the circuit. The resulting system's runtime increases linearly with circuit size, therefore indicating high efficiency of this system when emulating large and complex circuits.
机译:为了设计容错数字系统,有必要在设计的早期阶段就了解存在故障时的行为。故障仿真是一个有目的地将故障注入软件电路模型并观察其故障行为的过程。但是,当测试电路变大时,这种仿真的运行时间将呈指数增长。基于FPGA的故障仿真是在FPGA中实现的故障仿真,是加速故障仿真过程的有效方法。本文介绍了一种利用基于模块的动态部分重配置的,基于FPGA的新型开关级故障仿真系统。在这种方法中,故障在开关级建模,并映射到门级描述,以实现高效的FPGA实现。使用不平衡分区结构对被测电路进行分区,以便仅将故障注入小型子电路中。使用基于模块的动态部分重配置,可以将有故障的电路分区下载到FPGA,而无需擦除电路的无故障部分。结果系统的运行时间随电路大小线性增加,因此在仿真大型复杂电路时表明该系统具有很高的效率。

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