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Guest Editorial: 2007 EuroSimE conference on thermal, mechanical and multi-physics simulation and experiments in micro-electronics and micro-systems

机译:客座社论:2007年EuroSimE会议,涉及微电子和微系统的热,机械和多物理场模拟与实验

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摘要

This special issue includes selected papers presented at the 8th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE). This year the conference was organised in London (England) thanks to local organizer Prof. Chris Bailey from University of Greenwich.The annual EuroSimE conference was initiated in 2000 as the only international conference with direct focus on Thermal, Mechanical and Multi-Physics Simulations and Experiments in Micro-Electronics and Micro-Systems. Each year Technical Committee makes a substantial effort to provide high quality papers, presentations, exhibitions and workshops, which highlight the major research, technological and industrial development trends, challenges and roadmaps.
机译:本期特刊包括在第八届微电子和微系统的热,机械和多物理模拟与实验国际会议(EuroSimE)上发表的论文。今年的会议由格林威治大学的本地组织者Chris Bailey教授在伦敦(英国)举办。一年一度的EuroSimE会议于2000年启动,是唯一直接关注热,机械和多物理模拟和微电子学和微系统中的实验。每年,技术委员会都会竭尽全力提供高质量的论文,演讲,展览和讲习班,重点介绍主要的研究,技术和工业发展趋势,挑战和路线图。

著录项

  • 来源
    《Microelectronics reliability》 |2008年第6期|p.803-804|共2页
  • 作者

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 一般性问题;
  • 关键词

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