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机译:宽度过渡铜互连中的电迁移
Department of Electronics, West Bengal State University, Barasat, 24 Parganas (North), Berunanpukuria, Malikapur, Kolkata 700 126, India;
School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639 798, Singapore;
School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639 798, Singapore;
机译:线宽对长短铜互连的电迁移性能的依赖性
机译:线宽对长短铜互连的电迁移性能的依赖性
机译:宽度缩放和布局变化对双镶嵌铜互连电迁移的影响
机译:宽度过渡对Cu互连电迁移可靠性的影响
机译:同步加速器多色X射线Laue微衍射研究铝(铜)互连件和无铅焊点中电迁移的原因。
机译:铜双镶嵌互连的早期电迁移失败的紧凑模型
机译:线宽与机械强度对“近竹”晶粒结构互连电迁移失效的影响模型