...
机译:大功率IGBT模块未夹紧运行期间的不稳定机制
Dept. of Automation, Electromagnetism, Information Engineering and Industrial Mathematics, University of Cassino Via G. Di Biasio, 43, 03043 Cassino (FR), Italy;
Dept. of Automation, Electromagnetism, Information Engineering and Industrial Mathematics, University of Cassino Via G. Di Biasio, 43, 03043 Cassino (FR), Italy;
Dept. of Automation, Electromagnetism, Information Engineering and Industrial Mathematics, University of Cassino Via G. Di Biasio, 43, 03043 Cassino (FR), Italy;
Dept. of Automation, Electromagnetism, Information Engineering and Industrial Mathematics, University of Cassino Via G. Di Biasio, 43, 03043 Cassino (FR), Italy;
机译:非钳位感应开关过程中IGBT不同故障机理的实验检测与数值验证
机译:在未钳位的电感开关条件下功率MOSFET和IGBT的动态雪崩行为
机译:大功率IGBT模块中焊点的寿命分析,以提高在150℃下运行的可靠性
机译:未挤出电感式切换条件下IGBT的非均匀操作的研究
机译:两级栅极驱动方案,用于功率MOSFET和IGBT的无故障工作。
机译:低功耗和常规操作模式下HfOx-ReRAM中的切换机制研究
机译:栅极 - 发射器预阈值电压作为EGBT芯片故障监控的Health敏感参数,在高压MultiChip IGBT电源模块中监控