机译:CLC n-TFT在漏极雪崩热载流子应力作用下漏极电流退化的趋势转换
Institute of Mechatronic Engineering, National Taipei University of Technology, Taipei, Taiwan;
Institute of Mechatronic Engineering, National Taipei University of Technology, Taipei, Taiwan Department of Electronic Engineering, Ming-Hsin University of Science and Technology, No. 1 Hsin-Hsing Road, Hsin-Fong, Hsin-Chu 304, Taiwan;
Department of Material Science and Engineering, National Chiao Tung University, Hsin-Chu, Taiwan;
National Nano Device Laboratories, Hsin-Chu, Taiwan;
Department of Material Science and Engineering, National Chiao Tung University, Hsin-Chu, Taiwan;
Institute of Mechatronic Engineering, National Taipei University of Technology, Taipei, Taiwan;
Institute of Mechatronic Engineering, National Taipei University of Technology, Taipei, Taiwan;
机译:改进BSIM4的漏极电流表达式,以进行热载流子退化建模,适用于模拟应用
机译:高功率直流应力下GaN HEMT中漏极电流退化的激活能
机译:在时空上解决热载流子应力下n沟道多晶硅薄膜晶体管的退化
机译:CLC TFT温度变化下的表面通道漏极热载波效果
机译:蒙特卡洛研究了低功率深亚微米n-MOSFET中的热载流子退化和器件性能。
机译:相关时间-0和热载波应力诱导FinFET参数变量:建模方法
机译:由于高场,热载流子和辐射应力,n沟道多晶硅TFT的器件性能下降
机译:双极晶体管中热载流子应力与电离诱导退化的相关性