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Creep lifetime prediction of solder joint for heat sink assembly

机译:散热器组装焊点的蠕变寿命预测

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摘要

The heat sink assembly in a server station is anticipated to creep to fail at the solder joint under a constant load and temperature condition. To predict the lifetime of solder joint in the system, accelerated creep-rupture tests are conducted. Three loads of 4, 6, and 8 kg and temperatures of 35, 55, and 65 ℃ are selected for the tests. Larson-Miller model is adopted for the lifetime prediction, which requires tested lifetime data and stress analyses for the solder joint. An FE model for the stress analyses is developed and validated experimentally. Analyzed Larson-Miller constants show different tendency in the 8 kg load cases. Extensive failure analyses on the failed solder joints reveal the transition of failure mechanism at 8 kg load cases from the intergranular to the transgranular creep. Using only the validated test data of 4 and 6 kg load cases, creep lifetime prediction model for the solder joint in the heat sink assembly is developed and applied for a field condition.
机译:在恒定的负载和温度条件下,预计服务器站中的散热器组件会在焊点处蠕变而失效。为了预测系统中焊点的寿命,进行了加速蠕变断裂测试。测试选择了4、6和8 kg的三个负载以及35、55和65℃的温度。寿命预测采用Larson-Miller模型,该模型需要测试的寿命数据和焊点应力分析。建立了应力分析的有限元模型,并进行了实验验证。经分析的Larson-Miller常数在8 kg载荷情况下显示出不同的趋势。对失效焊点的大量失效分析表明,在8 kg载荷工况下,失效机理从晶间蠕变到晶间蠕变。仅使用经过验证的4 kg和6 kg载荷工况的测试数据,开发了散热器组件中焊点的蠕变寿命预测模型,并将其应用于现场条件。

著录项

  • 来源
    《Microelectronics & Reliability 》 |2010年第11期| p.1645-1649| 共5页
  • 作者单位

    Physics-of-Failure Research Center, Korea Electronics Technology Institute, Seongnam, Republic of Korea #68 Yatap-dong Bundang-gu, Seongnam 463-816, Republic of Korea;

    rnPhysics-of-Failure Research Center, Korea Electronics Technology Institute, Seongnam, Republic of Korea;

    rnPhysics-of-Failure Research Center, Korea Electronics Technology Institute, Seongnam, Republic of Korea;

    rnPhysics-of-Failure Research Center, Korea Electronics Technology Institute, Seongnam, Republic of Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
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