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Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches

机译:研究欧姆RF-MEMS开关的驱动速度,弹跳发生和接触可靠性

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摘要

The influence of the bias signal waveform on the electromechanical dynamic response of ohmic RF-MEMS switches is here investigated by means of electromechanical characterizations and modelling procedures. The actuation transient of ohmic RF-MEMS switches was studied in this work developing a fast to compute, but comprehensive electromechanical model, using electromechanical parameters from experimental results. The developed model was then used to investigate how different bias waveforms influence the switch dynamic, in terms of actuation time, and bounces occurrences, and a practical solution to limit bounces, without compromising the actuation time was presented. Furthermore, it was demonstrated how it is possible to improve the reliability to cycling stress using ad hoc shaped bias signals.
机译:本文通过机电特性分析和建模程序研究了偏置信号波形对欧姆RF-MEMS开关机电动态响应的影响。在这项工作中,研究了欧姆型RF-MEMS开关的驱动瞬态,利用实验结果中的机电参数,开发了一种可快速计算但综合的机电模型。然后,使用开发的模型来研究不同的偏置波形如何在启动时间和反弹次数方面影响开关动态,并提出了一种在不影响启动时间的情况下限制反弹的实用解决方案。此外,还展示了如何使用ad hoc形偏置信号来提高循环应力的可靠性。

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  • 来源
    《Microelectronics & Reliability》 |2010年第11期|p.1604-1608|共5页
  • 作者单位

    University of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy;

    rnUniversity of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy;

    rnUniversity of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy;

    rnUniversity of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy;

    rnUniversity of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
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